Technical Workshop on Kelvin Probe Force Microscopy

This satellite meeting of the NCAFM 2008 conference in Madrid is focused on Kelvin Probe Force Microscopy (KPFM) and on closely related techniques. It will take place on Monday, September 15th, 2008 from 2PM till 6PM, exactly one day before the beginning of the NCAFM Conference.

We observed an increasing number of contributions in the field of KPFM in the last years. Recently, also high resolution experiments showing molecular and atomic contrast on various substrates. The physics as well as the imaging mechanism behind these measurements are still not well understood. Furthermore, there are still many questions concerning KPFM such as the limits of special and electrical resolution and cross talk between the topographical and electrical signals.

The workshop will provide a platform to discuss these technical and fundamental aspects of this special field of scanning probe microscopy (SPM) in detail. For this purpose, outstanding scientists working in that field will present their work in talks to stimulate and provoke the discussion. The target groups of the workshop are theoreticians and experimentalists working in SPM, nevertheless newcomers and students will have the chance to get a comprehensive overview in the field of KPFM. The main topics discussed will include:



  • physical and technical aspects of AM- and FM-mode KPFM
  • absolute determination of the work function/surface potential
  • towards the understanding the atomic contrast in KPFM
  • connection between topographical and electrical signals
  • new applications and techniques related to KPFM
  • development of adequate theoretical models
  • simulation of KPFM experiments



    Organizers:

    Thilo Glatzel

    (University of Basel)


    Sascha Sadewasser

    (Hahn-Meitner Institute, Berlin)


    Rubén Pérez

    (Universidad Autónoma de Madrid)





    Program
    pdf version



    Chair: Th. Glatzel
    14:00-14:45:
    Kelvin Probe Force Microscopy: A comparison of different methods and their resolution in experiment and simulation
    Christian Loppacher, Universités Paul Cézanne, 13397 Marseille, FRANCE

    14:45-15:30:
    Quantitative KPFM : Semiconductors and self-assembled monolayers
    Yossi Rosenwaks, Tel-Aviv University, Ramat-Aviv 69978, ISRAEL

    15:30-16:15:
    Atomistic simulations of AFM junctions using SciFi code with possible applications for KPFM
    Lev Kantorovich, King's College London, London WC2R 2LS, UNITED KINGDOM

    16:15-16:45:
    Coffee break

    Chair: S. Sadewasser
    16:45-17:30:
    Some aspects of high-resolution imaging in KPFM
    Laurent Nony, Universités Paul Cézanne, 13397 Marseille, FRANCE

    17:30-18:15:
    Charge transfer induced by adatoms and admolecules
    Hiroshi Onishi, Kobe University, Kobe 657-8501, JAPAN


    18:15-19:00:
    Discussion
    Chairs:
    Adam Foster, Helsinki University of Technology, FIN-02015 HUT, FINLAND
    Roland Bennewitz, Leibniz Institut für Neue Materialien, Saarbrücken, GERMANY