Non-Contact Atomic Force Microscopy (NC-AFM) is a dynamic scanning force microscopy technique that has fulfilled the long-standing goal of true atomic resolution imaging in metal, semiconductor and insulating surfaces. While traditionally performed in ultra-high vacuum, recent developments have extended its high-resolution capabilities to technologically relevant environments, including liquids, biological solutions and ambient conditions. The conference in Madrid (Spain) continues the series of international conferences that have been held in Osaka, Japan (1998); Pontresina, Switzerland (1999); Hamburg, Germany (2000); Kyoto, Japan (2001); Montreal, Canada (2002); Dingle, Ireland (2003); Seattle, USA (2004); Bad Essen, Germany (2005); Kobe, Japan (2006); and Antalya, Turkey (2007). The conference covers experimental, theoretical and instrumental contributions on frequency modulation and other dynamic operation modes that focus on achieving the highest resolution in imaging and force spectroscopy of any well prepared surface. The conference welcomes contributions dealing with one or more of the following topics:

1. Novel Instrumentation and techniques in dynamic AFM.
2. Small amplitude and lateral force measurements
3. Atomic resolution imaging on surfaces and molecular systems.
4. Highest resolution imaging of clusters, biomolecules and biological systems.
5. Atomic- and molecular-scale manipulation.
6. Theoretical analysis of contrast mechanisms. Forces & tunnelling phenomena.
7. Simulation of images and virtual SFM systems.
8. Measuring tip-sample interaction potentials and mapping force fields.
9. Mechanisms for damping and energy dissipation.
10. Amplitude modulation versus Frequency modulation imaging.
11. Imaging and spectroscopy in liquid environments.
12. Measuring nanoscale charges, work function and magnetic properties
13. Characterisation and modification of force microscopy tips at the atomic scale.